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Disambiguation of "Bagga, Navjeet"

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Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.

, , , , , and . IRPS, page 5-1. IEEE, (2022)

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Other publications of authors with the same name

Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI., , , , , , , , , and 1 other author(s). IRPS, page 23-1. IEEE, (2022)Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET., , , and . Microelectron. J., (September 2023)Impact of Temperature on NDR Characteristics of a Negative Capacitance FinFET: Role of Landau Parameter (α)., , , and . VDAT, volume 1687 of Communications in Computer and Information Science, page 97-106. Springer, (2022)Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET., , , , , , and . IRPS, page 1-5. IEEE, (2023)Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective., , , , , , and . VDAT, volume 1687 of Communications in Computer and Information Science, page 85-96. Springer, (2022)Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification., , , and . VDAT, page 1-5. IEEE, (2020)Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET., , , , , , , and . IRPS, page 1-6. IEEE, (2021)Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage., , , , , and . IRPS, page 5-1. IEEE, (2022)Self-Heating and Process-Induced Threshold Voltage Aware Reliability and Aging Analysis of Forksheet FET., , and . IRPS, page 65. IEEE, (2024)Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor., , , , , , , and . SENSORS, page 1-4. IEEE, (2023)