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Другие публикации лиц с тем же именем

New Challenges for Designers of Fault Tolerant Embedded Systems Based on Future Technologies., и . IESS, том 310 из IFIP Advances in Information and Communication Technology, стр. 312-313. Springer, (2009)Reliability aware yield improvement technique for nanotechnology based circuits., , , , и . SBCCI, ACM, (2009)Single element correction in sorting algorithms with minimum delay overhead., , , и . LATW, стр. 1-6. IEEE, (2009)Increasing memory yield in future technologies through innovative design., , , , и . ISQED, стр. 622-626. IEEE Computer Society, (2009)Using Memory to Cope with Simultaneous Transient Faults., , и . LATW, стр. 151-156. IEEE, (2006)A fast error correction technique for matrix multiplication algorithms., , , и . IOLTS, стр. 133-137. IEEE Computer Society, (2009)Using built-in sensors to cope with long duration transient faults in future technologies., , , , и . ITC, стр. 1-10. IEEE Computer Society, (2007)Multiple Bit Error Detection and Correction in Memory., , , , и . DSD, стр. 652-657. IEEE Computer Society, (2010)XOR-based Low Cost Checkers for Combinational Logic., и . DFT, стр. 281-289. IEEE Computer Society, (2008)Invariant checkers: An efficient low cost technique for run-time transient errors detection., , , и . IOLTS, стр. 35-40. IEEE Computer Society, (2009)