( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations.

, , , , , , , , , , , , , , , и . ISSCC, стр. 326-606. IEEE, (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Kenichi Shinohara

Hirofumi Ishihara

Hirofumi Hosokawa

Hirofumi Kumazawa

Hirofumi Ueda

 

Другие публикации лиц с тем же именем

Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling., , , , , , и . DAC, стр. 884-889. ACM, (2008)Variation-aware subthreshold logic circuit design., , , , , и . ASICON, стр. 1-4. IEEE, (2013)A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die., , , , , , , , , и 7 other автор(ы). ISSCC, стр. 488-617. IEEE, (2007)A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations., , , , , , , , , и 6 other автор(ы). ISSCC, стр. 326-606. IEEE, (2007)On-chip leakage monitor circuit to scan optimal reverse bias voltage for adaptive body-bias circuit under gate induced drain leakage effect., , , , и . ESSCIRC, стр. 258-261. IEEE, (2008)A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response., , , , и . CICC, стр. 1-2. IEEE, (2023)An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit., , , , и . MWSCAS, стр. 285-288. IEEE, (2020)A 40-nm 8T SRAM with selective source line control of read bitlines and address preset structure., , , , , и . CICC, стр. 1-4. IEEE, (2013)60% Cycle time acceleration, 55% energy reduction, 32Kbit SRAM by auto-selective boost (ASB) scheme for slow memory cells in random variations., , , , , и . ESSCIRC, стр. 317-320. IEEE, (2012)A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance., , , , и . ESSCIRC, стр. 513-516. IEEE, (2022)