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Disambiguation of "Asenov, Asen"

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Scalable Parallel 3D Finite Element Nonlinear Poisson Solver.

, , , and . EUROSIM, page 665-672. Elsevier, (1994)

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Silvia Asen

Hans Asen

Michaela Asen

Florian Asen

Asen Kalojanov

 

Other publications of authors with the same name

Special section reliability and variability of devices for circuits and systems., , , , and . Microelectron. Reliab., 54 (6-7): 1057 (2014)Statistical NBTI-effect prediction for ULSI circuits., , , and . ISCAS, page 2494-2497. IEEE, (2010)ICMAT 2011 - Reliability and variability of semiconductor devices and ICs., , , , and . Microelectron. Reliab., 52 (8): 1531 (2012)The First International Competition in Machine Reconnaissance Blind Chess., , , , , , , , , and 5 other author(s). NeurIPS (Competition and Demos), volume 123 of Proceedings of Machine Learning Research, page 121-130. PMLR, (2019)Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability., , , , and . ESSDERC, page 349-352. IEEE, (2014)Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures., , , , , , , , and . Microelectron. Reliab., 50 (3): 360-364 (2010)Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part II: CNT Interconnect Optimization., , , , , , , , , and 2 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 30 (4): 440-448 (2022)Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage., , , , , and . ESSDERC, page 230-233. IEEE, (2013)Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation., , , , and . ESSDERC, page 109-112. IEEE, (2012)Enabling Cutting-Edge Semiconductor Simulation through Grid Technology., , , , , , , and . LSSC, volume 5910 of Lecture Notes in Computer Science, page 369-378. Springer, (2009)