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Diagnosis and characterization of timing-related defects by time-dependent light emission.

, , , , , , , , , , and . ITC, page 733-739. IEEE Computer Society, (1998)

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Design and implementation of high performance dynamic 64-bit parallel adder with enhanced testability., , , , and . CICC, page 519-522. IEEE, (1998)Statistical Fault Injection., , , , and . DSN, page 122-127. IEEE Computer Society, (2008)The concern for soft errors is not overblown.. ITC, page 2. IEEE Computer Society, (2005)The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA)., , , , , , , , , and . ITC, page 883-891. IEEE Computer Society, (1999)Soft-error resilience of the IBM POWER6 processor input/output subsystem., , , , , , and . IBM J. Res. Dev., 52 (3): 285-292 (2008)Optical and Electrical Testing of Latchup in I/O Interface Circuits., , , , , , , and . ITC, page 236-245. IEEE Computer Society, (2003)Soft Errors: Technology Trends, System Effects, and Protection Techniques., , and . IOLTS, page 4. IEEE Computer Society, (2007)Guest Editors' Introduction: Reliability-Aware Microarchitecture., and . IEEE Micro, 25 (6): 8-9 (2005)Cross-layer resilience challenges: Metrics and optimization., , and . DATE, page 1029-1034. IEEE Computer Society, (2010)Diagnosis and characterization of timing-related defects by time-dependent light emission., , , , , , , , , and 1 other author(s). ITC, page 733-739. IEEE Computer Society, (1998)