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Disambiguation of "Nigh, Phil"

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Diagnosis and characterization of timing-related defects by time-dependent light emission.

, , , , , , , , , , and . ITC, page 733-739. IEEE Computer Society, (1998)

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Michael Nightingale

Phil Zundel

Phil Langer

Phil Liebing

Phil Blunsom

 

Other publications of authors with the same name

Physically-Aware N-Detect Test., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (2): 308-321 (2012)SIA Roadmap: test must not limit future technologies.. ITC, page 1152. IEEE Computer Society, (1998)Industry leaders panel - How will testing change in the next 10 years?. ITC, page 1. IEEE Computer Society, (2011)How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?. ITC, page 1-4. IEEE Computer Society, (2012)Board manufacturing test correlation to IC manufacturing test., , , and . ITC, page 1-8. IEEE Computer Society, (2014)Binning for IC Quality: Experimental Studies on the SEMATECH Data., , , and . DFT, page 4-10. IEEE Computer Society, (1998)Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work... ITC, page 1420. IEEE Computer Society, (2004)Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions., and . ITC, page 309-318. IEEE Computer Society, (2004)Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products.. ITC, page 1198. IEEE Computer Society, (2002)Application of non-parametric statistics of the parametric response for defect diagnosis., , , and . ITC, page 1-10. IEEE Computer Society, (2009)