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An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation., , , , , и . DATE, стр. 580-585. ACM, (2008)Variational capacitance extraction of on-chip interconnects based on continuous surface model., , и . DAC, стр. 758-763. ACM, (2009)Attention Routing: track-assignment detailed routing using attention-based reinforcement learning., , , , , , , и . CoRR, (2020)Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (12): 1814-1827 (2011)Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation., , , , и . ICCAD, стр. 47-54. IEEE, (2010)A dynamic method for efficient random mismatch characterization of standard cells., , , , , , и . ICCAD, стр. 180-186. ACM, (2012)Large-scale statistical performance modeling of analog and mixed-signal circuits., , и . CICC, стр. 1-8. IEEE, (2012)Automatic clustering of wafer spatial signatures., , , , и . DAC, стр. 71:1-71:6. ACM, (2013)IC Spatial Variation Modeling: Algorithms and Applications.. Carnegie Mellon University, USA, (2012)Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data., , , , и . DAC, стр. 64:1-64:6. ACM, (2013)