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Improved weight assignment for logic switching activity during at-speed test pattern generation.

, , , , , and . ASP-DAC, page 493-498. IEEE, (2010)

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Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing., , , and . ITC, page 1-10. IEEE Computer Society, (2008)Improved weight assignment for logic switching activity during at-speed test pattern generation., , , , , and . ASP-DAC, page 493-498. IEEE, (2010)Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing., , and . Asian Test Symposium, page 361-366. IEEE Computer Society, (2010)W-band OFDM RoF system with simple envelope detector down-conversion., , , and . OFC, page 1-3. IEEE, (2015)An Efficient Peak Power Reduction Technique for Scan Testing., , and . ATS, page 111-114. IEEE, (2007)LPTest: a Flexible Low-Power Test Pattern Generator., , and . J. Electron. Test., 25 (6): 323-335 (2009)Simple receiving scheme in 100-GHz DD OFDM RoF systems employing low-sampling-rate ADCs and digital preprocess., , , , , , , and . OFC, page 1-3. IEEE, (2015)A scalable quantitative measure of IR-drop effects for scan pattern generation., , , , , and . ICCAD, page 162-167. IEEE, (2010)PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment., , and . ATS, page 391-396. IEEE Computer Society, (2008)