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Process monitoring through wafer-level spatial variation decomposition.

, , , и . ITC, стр. 1-10. IEEE Computer Society, (2013)

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Michael Kupp

Martin Kupp

Nathan ben-Nathan

Hans Nathan

Siegfried Nathan

 

Другие публикации лиц с тем же именем

DFTT: Design for Trojan Test., , и . ICECS, стр. 1168-1171. IEEE, (2010)Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction., , , и . ETS, стр. 35-40. IEEE Computer Society, (2008)Integrated optimization of semiconductor manufacturing: A machine learning approach., и . ITC, стр. 1-10. IEEE Computer Society, (2012)Spatial estimation of wafer measurement parameters using Gaussian process models., , , и . ITC, стр. 1-8. IEEE Computer Society, (2012)Correlating inline data with final test outcomes in analog/RF devices., , и . DATE, стр. 812-817. IEEE, (2011)Silicon Demonstration of Statistical Post-Production Tuning., , , , и . ISVLSI, стр. 628-633. IEEE Computer Society, (2015)Spatial correlation modeling for probe test cost reduction in RF devices., , , и . ICCAD, стр. 23-29. ACM, (2012)On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction., , , и . J. Electron. Test., 25 (6): 309-321 (2009)Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier., , и . VTS, стр. 62-67. IEEE Computer Society, (2012)Process monitoring through wafer-level spatial variation decomposition., , , и . ITC, стр. 1-10. IEEE Computer Society, (2013)