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Disambiguation of "Dworak, Jennifer"

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Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis.

, , , , , and . ETS, page 211. IEEE Computer Society, (2011)

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Karl Dworak

Anselm Dworak

Regine Dworak

Peter Dworak

Alexander Dworak

 

Other publications of authors with the same name

3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations., , , , , and . IEEE Trans. Emerg. Top. Comput., 9 (2): 774-786 (2021)Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift., , , , and . J. Electron. Test., 39 (2): 227-243 (April 2023)When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG., , and . NATW, page 32-39. IEEE, (2014)One more time! Increasing fault detection with scan shift capture., , , and . NATW, page 1-7. IEEE, (2018)Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits., , , , , , and . ITC, page 319-323. IEEE, (2021)On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction., , , , , and . Asian Test Symposium, page 151-. IEEE Computer Society, (2000)Can Soft Errors be Handled Securely?, and . ISVLSI, page 124-129. IEEE Computer Society, (2018)Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects., , and . VTS, page 319-324. IEEE Computer Society, (2010)Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack., , , , , , and . J. Electron. Test., 35 (6): 887-900 (2019)Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects., , , and . DATE, page 1066-1071. IEEE Computer Society, (2004)