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Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism., , , , and . IECON, page 7969-7973. IEEE, (2017)An Experience of Engineering of MAS for Smart Environments: Extension of ASPECS., , , and . IIMSS, page 649-658. Springer, (2016)Performances of RF PA classes in LINC systems., , , , and . ISCAS, page 2179-2182. IEEE, (2012)Influence of the output harmonic networks of classes F and F-1 power amplifiers in LINC systems., , , , and . NEWCAS, page 477-480. IEEE, (2012)A 26-28 GHz, Two-Stage, Low-Noise Amplifier for Fifth-Generation Radio Frequency and Millimeter-Wave Applications., , , and . Sensors, 24 (7): 2237 (April 2024)La morale humaine et les sciences, , , , , , , , and . Sciences & Philosophie Éditions Matériologiques, (March 2011)Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems., , , , , , and . Microelectron. Reliab., 44 (9-11): 1559-1563 (2004)Applied TRL Calibration Method to Differential Devices Embedded in a Test Board., , , and . RWS, page 1-4. IEEE, (2019)Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings., , , , , and . WiSNet, page 100-102. IEEE, (2013)An Analysis and Prototyping Approach for Cyber-Physical Systems., , , , and . FNC/MobiSPC, volume 56 of Procedia Computer Science, page 520-525. Elsevier, (2015)