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Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells.

, , , , , , , , and . Asian Test Symposium, page 28-31. IEEE Computer Society, (2003)

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Two-stage Deep Neural Network for General Object Detection., and . J. Inf. Process., (2019)Seed Selection Procedure for LFSR-Based Random Pattern Generators., , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 86-A (12): 3063-3071 (2003)SCN-SAM: A Modified Self-Cure Network for Facial Expression Recognition Under Face Masks., , and . ICACT, page 411-416. IEEE, (2023)An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information., , , , and . DFT, page 1-6. IEEE, (2023)A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage., , , and . DFT, page 1-6. IEEE, (2023)Attended-Auxiliary Supervision Representation for Face Anti-spoofing., , and . ACCV (1), volume 12622 of Lecture Notes in Computer Science, page 436-452. Springer, (2020)Critical-Area-Aware Test Pattern Generation and Reordering., , and . ATS, page 191-196. IEEE Computer Society, (2016)Analysis of Read and Write Availability for Generalized Hybrid Data Replication Protocol., , , , , and . PRDC, page 143-150. IEEE Computer Society, (2004)An Experimental Study on Latch Up Failure of CMOS LSI., , and . SSIRI, page 215-216. IEEE Computer Society, (2008)A Practice Example of Object-Oriented Programming Education Using WebCT., , , , and . ICCE, volume 133 of Frontiers in Artificial Intelligence and Applications, page 871-874. IOS Press, (2005)