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Defects, Fault Modeling, and Test Development Framework for RRAMs.

, , , , , , и . ACM J. Emerg. Technol. Comput. Syst., 18 (3): 52:1-52:26 (2022)

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Guilherme Lepski

A comparative analysis of human adult mesenchymal and fetal neuronal stem cells with regard to their neurogenic potential. Uni Freiburg, (2009)

Pilar Medeiros

Hamilton Medeiros

António Medeiros

Ghendy Cardoso

 

Другие публикации лиц с тем же именем

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs., , , и . VLSI-SoC (Selected Papers), том 500 из IFIP Advances in Information and Communication Technology, стр. 22-45. Springer, (2017)DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs., , , , и . ETS, стр. 1-2. IEEE, (2019)NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time., , , и . J. Electron. Test., 32 (3): 315-328 (2016)Analyzing the behavior of FinFET SRAMs with resistive defects., , , и . VLSI-SoC, стр. 1-6. IEEE, (2017)Intermittent Undefined State Fault in RRAMs., , , , , и . ETS, стр. 1-6. IEEE, (2021)Hierarchical Memory Diagnosis., , , , , и . ETS, стр. 1-2. IEEE, (2022)Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects., , , , , и . LATS, стр. 1-6. IEEE, (2020)Hard-to-Detect Fault Analysis in FinFET SRAMs., , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 29 (6): 1271-1284 (2021)Defects, Fault Modeling, and Test Development Framework for RRAMs., , , , , , и . ACM J. Emerg. Technol. Comput. Syst., 18 (3): 52:1-52:26 (2022)PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory., , , , , , и . ETS, стр. 1-6. IEEE, (2022)