( en | de | ru )

 

Disambiguation of "Padovani, Andrea"

Author of the publication

copydeleteadd this publication to your clipboard
Random Telegraph Signal noise properties of HfOx RRAM in high resistive state.

, , , , and . ESSDERC, page 274-277. IEEE, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Andrea Witzenrath

Risikofaktoren für abdominelle Komplikationen nach kardiopulmonalem Bypass. Uni Erlangen-Nürnberg, (2009)

Andrea Rottach

Analysis of the cell cycle dependent dynamics of Dnmt1 and Np95 in living cells. Uni München, (2009)

Andrea Hruby

Die MAPKKK Bck1p des Zellwand-Integritätssignalwegs in der Bäckerhefe Saccharomyces cerevisiae. Uni Münster, (2009)

Michaela Andrea Fingas

Resultate nach radikaler Prostatektomie bei Patienten mit einem Prostatakarzinom Gleason 7-10. Uni Marburg, (2009)

Andrea Calker

 

Other publications of authors with the same name

Fundamental reliability issues of advanced charge-trapping Flash memory devices., and . ICECS, page 1009-1012. IEEE, (2010)Towards a Universal Model of Dielectric Breakdown., , , , , and . IRPS, page 1-8. IEEE, (2023)A multiscale modeling approach for the simulation of OxRRAM devices., , , and . NVMTS, page 1-8. IEEE, (2017)Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation., , , , , and . IRPS, page 4. IEEE, (2022)Random Telegraph Signal noise properties of HfOx RRAM in high resistive state., , , , and . ESSDERC, page 274-277. IEEE, (2012)Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects., , , , , and . IRPS, page 1-6. IEEE, (2019)Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS., , , and . ESSDERC, page 246-249. IEEE, (2014)Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents., , , , , , , and . IMW, page 1-4. IEEE, (2022)Self-rectifying non-volatile tunneling synapse: multiscale modeling augmented development., , , , , , , , , and 6 other author(s). IMW, page 1-4. IEEE, (2024)Connecting RRAM performance to the properties of the hafnia-based dielectrics., , , , , and . ESSDERC, page 163-165. IEEE, (2013)