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Power Driven Chaining of Flip-Flops in Scan Architectures.

, , , и . ITC, стр. 796-803. IEEE Computer Society, (2002)

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Benoît Girard

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Jules Girard

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Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity., , , , , , , и . ISCAS (1), стр. 110-113. IEEE, (1999)Effect-cause intra-cell diagnosis at transistor level., , , , , , и . ISQED, стр. 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing., , , , , и . VLSI-SoC, стр. 403-408. IEEE, (2006)Energy Model based Control for Forming Processes., и . ICINCO-ICSO, стр. 51-59. INSTICC Press, (2008)Towards a Model-Based Approach to Support Physical Test Process of Aircraft Hydraulic Systems., , , , , и . MEDI, том 12732 из Lecture Notes in Computer Science, стр. 33-40. Springer, (2021)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*., , , , , , , , , и 2 other автор(ы). ETS, стр. 1-10. IEEE, (2021)Fast Bridging Fault Diagnosis using Logic Information., , , , , и . ATS, стр. 33-38. IEEE, (2007)Power-Aware Test Data Compression for Embedded IP Cores., , , , , и . ATS, стр. 5-10. IEEE, (2006)Example-based programming: a pertinent visual approach for learning to program., , и . AVI, стр. 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation., , и . IHM, том 264 из ACM International Conference Proceeding Series, стр. 147-154. ACM, (2005)