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MANTIS: Machine Learning-Based Approximate ModeliNg of RedacTed Integrated CircuitS., , and . DATE, page 1-6. IEEE, (2023)TRANSPARENT: a system for RTL testability analysis, DFT guidance and hierarchical test generation., , , and . CICC, page 159-162. IEEE, (1999)Transparency-based hierarchical test generation for modular RTL designs., , , and . ISCAS, page 689-692. IEEE, (2000)Exploiting Off-Line Hierarchical Test Paths in Module Diagnosis and On-Line Test., and . LATW, page 250-255. IEEE, (2000)Secure Logic Locking with Strain-Protected Nanomagnet Logic., , , , , , , , , and 3 other author(s). DAC, page 127-132. IEEE, (2021)Integrated optimization of semiconductor manufacturing: A machine learning approach., and . ITC, page 1-10. IEEE Computer Society, (2012)Spatial estimation of wafer measurement parameters using Gaussian process models., , , and . ITC, page 1-8. IEEE Computer Society, (2012)Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion., , , , , and . ITC, page 1-3. IEEE, (2019)Hardware Dithering: A Run-Time Method for Trojan Neutralization in Wireless Cryptographic ICs., , , and . ITC, page 1-7. IEEE, (2018)Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case., , and . ICCD, page 194-197. IEEE Computer Society, (2003)