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An Alternative Post-bond Testing Method for TSVs., , and . MOCAST, page 1-4. IEEE, (2020)Wavelet analysis of current measurements for mixed-signal circuit testing., , , and . ISCAS, page 1923-1926. IEEE, (2010)Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region., , , , and . ISCAS, IEEE, (2006)Modeling the Coupling through Substrate for Frequencies up to 100GHz., , and . DDECS, page 165-168. IEEE Computer Society, (2015)Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach., , , , and . DDECS, page 251-254. IEEE Computer Society, (2008)Efficient testing of an optical feedback pixel driver using wavelet analysis., , , and . ICECS, page 1041-1044. IEEE, (2010)Multiple Parametric Circuit Analysis Tool for Detectability Estimation., , , , and . ICECS, page 1111-1114. IEEE, (2007)Fault Detection in Linear Bipolar ICs: Comparative Results Between Power Supply Current and Output Voltage Measurements., and . ISCAS, page 61-64. IEEE, (1994)Efficient inductance calculation for long and medium length rectangular interconnects in VLSI circuits., , and . ISCAS, page 2337-2340. IEEE, (2011)Input stimulus comparison using an adaptive FPGA-based testing system., , , and . ISCAS, page 277-280. IEEE, (2014)