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Some considerations on choosing an outlier method for automotive product lines., , , , , and . ITC, page 1-10. IEEE, (2017)On-chip sensor selection for effective speed-binning., , , and . MWSCAS, page 1073-1076. IEEE, (2014)Forward prediction based on wafer sort data - A case study., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests., , and . VTS, page 1-6. IEEE Computer Society, (2014)Understanding customer returns from a test perspective., , , , and . VTS, page 2-7. IEEE Computer Society, (2011)Outsourcing DFT: it can be done but it isn't easy.. ITC, page 2. IEEE Computer Society, (2005)Special session 5B: Panel How much toggle activity should we be testing with?, , , , , and . VTS, page 114. IEEE Computer Society, (2011)Learning the process for correlation analysis., , , and . VTS, page 1-6. IEEE Computer Society, (2017)A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs., , and . VTS, page 1-6. IEEE Computer Society, (2015)Generalization of an outlier model into a "global" perspective., , , , , and . ITC, page 1-10. IEEE, (2015)