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Disambiguation of "Belleville, Marc"

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Sub-1V, Robust and Compact 6T SRAM cell in Double Gate MOS technology.

, , and . ISCAS, page 2778-2781. IEEE, (2007)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Andreé Belleville

Stefanie Marczoch

Langzeitverlauf von 200 Patienten mit kraniofazialen und zervikalen Dystonien bis zu 12 Jahre nach der ersten Botulinumtoxin-Behandlung. TU München, (2009)

Ivan Marchesini

André Marchand

Britta Marcinek

 

Other publications of authors with the same name

Experimental analysis of flip-flops minimum operating voltage in 28nm FDSOI and the impact of back bias and temperature., , , , and . PATMOS, page 1-7. IEEE, (2014)Multi-application electrical stimulator architecture dedicated to waveform control by electrode-tissue impedance spectra monitoring., , , and . ICECS, page 33-36. IEEE, (2012)3D Integration for Digital and Imagers Circuits: Opportunities and Challenges.. PATMOS, volume 6448 of Lecture Notes in Computer Science, page 256. Springer, (2010)Digital Timing Slack Monitors and Their Specific Insertion Flow for Adaptive Compensation of Variabilities., , , , , , and . PATMOS, volume 5953 of Lecture Notes in Computer Science, page 266-275. Springer, (2009)A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing., , , and . ICICDT, page 1-4. IEEE, (2012)Energy autonomous sensor systems: Towards a ubiquitous sensor technology., , , , , , , , , and 1 other author(s). Microelectron. J., 41 (11): 740-745 (2010)Computing detection probability of delay defects in signal line tsvs., , , , , , , and . ETS, page 1-6. IEEE Computer Society, (2013)Dedicated network for distributed configuration in a mixed-signal Wireless Sensor Node circuit., , and . PATMOS, page 55-62. IEEE, (2015)Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era., , , and . JETC, 13 (2): 12:1-12:2 (2016)A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits., , , , and . DATE, page 1056-1057. EDA Consortium San Jose, CA, USA / ACM DL, (2013)