( en | de | ru )

 

Disambiguation of "McCluskey, Edward J."

Author of the publication

copydeleteadd this publication to your clipboard
An Experimental Study Comparing 74LS181 Test Sets.

, , and . COMPCON, page 384-387. IEEE Computer Society, (1985)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Edward J Birkenbeil

Edward J Birkenbeil

Edward J Laarman

Edward Fischer

Edward Sobel

 

Other publications of authors with the same name

Iterative Combinational Switching Networksߞ General Design Considerations.. IRE Trans. Electron. Comput., 7 (4): 285-291 (1958)Built-In Verification Test.. ITC, page 183-190. IEEE Computer Society, (1982)An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets., and . ITC, page 52-58. IEEE Computer Society, (1984)Test Teaching.. ITC, page 235. IEEE Computer Society, (1985)An Experimental Study Comparing 74LS181 Test Sets., , and . COMPCON, page 384-387. IEEE Computer Society, (1985)Verification testing.. DAC, page 495-500. ACM/IEEE, (1982)Speed Clustering of Integrated Circuits., , , and . ITC, page 1128-1137. IEEE Computer Society, (2004)Which concurrent error detection scheme to choose ?, and . ITC, page 985-994. IEEE Computer Society, (2000)Launch-on-Shift-Capture Transition Tests., and . ITC, page 1-9. IEEE Computer Society, (2008)A simple technique for locating gate-level faults in combinational circuits., , and . Asian Test Symposium, page 65-70. IEEE Computer Society, (1995)