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Test Teaching.. ITC, page 235. IEEE Computer Society, (1985)Built-In Verification Test.. ITC, page 183-190. IEEE Computer Society, (1982)An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets., and . ITC, page 52-58. IEEE Computer Society, (1984)An Experimental Study Comparing 74LS181 Test Sets., , and . COMPCON, page 384-387. IEEE Computer Society, (1985)Test and Diagnosis Procedure for Digital Networks.. Computer, 4 (1): 17-20 (1971)Iterative Combinational Switching Networksߞ General Design Considerations.. IRE Trans. Electron. Comput., 7 (4): 285-291 (1958)Open faults in BiCMOS gates., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (5): 567-575 (1995)Summary of Structural integrity Checking., , and . RTSS, page 107-109. IEEE Computer Society, (1980)IC Quality and Test Transparency., and . ITC, page 295-301. IEEE Computer Society, (1988)Refined Bounds on Signature Analysis Aliasing for Random Testing., , and . ITC, page 818-827. IEEE Computer Society, (1991)