( en | de | ru )

 

Disambiguation of "Noll, Tobias G."

Author of the publication

copydeleteadd this publication to your clipboard
Analysis of the area-delay performance of hybrid nanoelectronic memory cores used in field programmable gate arrays.

, , and . ACM Great Lakes Symposium on VLSI, page 233-238. ACM, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Tobias Nöll

Tobias Noll

Tobias Noll

Tobias Gebhard Noll

Tobias G Wenzl

 

Other publications of authors with the same name

An accurate power estimation model for low-power hierarchical-architecture SRAMs., and . VLSI-SoC, page 144-149. IEEE, (2013)Classification Framework for Analysis and Modeling of Physically Induced Reliability Violations., , , , , , , and . ACM Comput. Surv., 47 (3): 38:1-38:33 (2015)Verbesserung der Dynamik und Ortsauflösung in der Ultraschalldiagnostik durch die Kombination kodierter Anregung und tiefenangepaßter Mismatched-Filterung., , , and . Bildverarbeitung für die Medizin, volume 12 of CEUR Workshop Proceedings, Springer, (1998)Artefaktreduzierung in der ultraschnellen Magnetresonanz-Bildgebung mittels inverser Filterung im Ortsfrequenzbereich., , and . Bildverarbeitung für die Medizin, volume 6 of CEUR Workshop Proceedings, CEUR-WS.org, (1996)A radix-4 single-precision floating point divider based on digit set interleaving., and . ISCAS, page 709-712. IEEE, (2010)A hybrid CMOS/memristive nanoelectronic circuit for programming synaptic weights., and . ESANN, (2012)A new scalable VLSI architecture for Reed-Solomon decoders., , and . CICC, page 13-16. IEEE, (1998)Noise Margin Based Library Optimization Considering Variability in Sub-threshold., , and . PATMOS, volume 7606 of Lecture Notes in Computer Science, page 72-82. Springer, (2012)A Physically Oriented Model to Quantify the Noise-on-Delay Effect., and . PATMOS, volume 3254 of Lecture Notes in Computer Science, page 879-888. Springer, (2004)Statistical modeling of reliability in logic devices., , and . Microelectron. Reliab., 51 (9-11): 1469-1473 (2011)