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IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs.

, , , и . ISCAS, стр. 1-5. IEEE, (2021)

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Saqib Saeed

Saqib Saeed

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Saqib Ehsan

 

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Delay Test for Diagnosis of Power Switches., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 22 (2): 197-206 (2014)Bridge Defect Diagnosis for Multiple-Voltage Design., , , , и . ETS, стр. 99-104. IEEE Computer Society, (2008)Fault Tolerance in 3D-ICs., , и . Security and Fault Tolerance in Internet of Things, Springer, (2019)Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation., , и . Asian Test Symposium, стр. 378-385. IEEE Computer Society, (2005)Application-specific memory protection policies for energy-efficient reliable design., , , , , и . RSP, стр. 18-24. IEEE, (2015)BTI and leakage aware dynamic voltage scaling for reliable low power cache memories., , , и . IOLTS, стр. 194-199. IEEE, (2015)Diagnosis of power switches with power-distribution-network consideration., , , и . ETS, стр. 1-6. IEEE, (2015)Recycled IC detection through aging sensor., , , и . ETS, стр. 1-2. IEEE, (2018)Secure Scan Design with a Novel Methodology of Scan Camouflaging., , , и . ECCTD, стр. 1-4. IEEE, (2020)IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs., , , и . ISCAS, стр. 1-5. IEEE, (2021)