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Delay Test for Diagnosis of Power Switches., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (2): 197-206 (2014)Bridge Defect Diagnosis for Multiple-Voltage Design., , , , and . ETS, page 99-104. IEEE Computer Society, (2008)Fault Tolerance in 3D-ICs., , and . Security and Fault Tolerance in Internet of Things, Springer, (2019)Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation., , and . Asian Test Symposium, page 378-385. IEEE Computer Society, (2005)Application-specific memory protection policies for energy-efficient reliable design., , , , , and . RSP, page 18-24. IEEE, (2015)Secure Scan Design with a Novel Methodology of Scan Camouflaging., , , and . ECCTD, page 1-4. IEEE, (2020)Diagnosis of power switches with power-distribution-network consideration., , , and . ETS, page 1-6. IEEE, (2015)Recycled IC detection through aging sensor., , , and . ETS, page 1-2. IEEE, (2018)BTI and leakage aware dynamic voltage scaling for reliable low power cache memories., , , and . IOLTS, page 194-199. IEEE, (2015)IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs., , , and . ISCAS, page 1-5. IEEE, (2021)