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Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications.

H. Amrouch, X. Hu, M. Imani, A. Laguna, M. Niemier, S. Thomann, X. Yin, and C. Zhuo. ASP-DAC, page 132-139. ACM, (2021)

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Hussam Amrouch

Hussam Hamrawi

Hussam Haffar

Hussam Asi

Hussam Sheta

Other publications of authors with the same name

Reliability Challenges with Self-Heating and Aging in FinFET Technology.H. Amrouch, V. van Santen, O. Prakash, H. Kattan, S. Salamin, S. Thomann, and J. Henkel. IOLTS, page 68-71. IEEE, (2019)Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation.F. Torres, H. Amrouch, J. Henkel, and R. Drechsler. IRPS, page 1-6. IEEE, (2019)Impact of Radiation on Negative Capacitance FinFET.G. Bajpai, A. Gupta, O. Prakash, G. Pahwa, J. Henkel, Y. Chauhan, and H. Amrouch. IRPS, page 1-5. IEEE, (2020)Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture.M. Yayla, S. Thomann, S. Buschjäger, K. Morik, J. Chen, and H. Amrouch. IEEE Trans. Circuits Syst. I Regul. Pap., 69 (6): 2516-2528 (2022)On the Resiliency of NCFET Circuits Against Voltage Over-Scaling.G. Paim, G. Zervakis, G. Pahwa, Y. Chauhan, E. da Costa, S. Bampi, J. Henkel, and H. Amrouch. IEEE Trans. Circuits Syst. I Regul. Pap., 68 (4): 1481-1492 (2021)Impact of NCFET on Neural Network Accelerators.G. Zervakis, I. Anagnostopoulos, S. Salamin, Y. Chauhan, J. Henkel, and H. Amrouch. IEEE Access, (2021)Unlocking Efficiency in BNNs: Global by Local Thresholding for Analog-Based HW Accelerators.M. Yayla, F. Frustaci, F. Spagnolo, J. Chen, and H. Amrouch. IEEE J. Emerg. Sel. Topics Circuits Syst., 13 (4): 940-955 (December 2023)Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications.J. Núñez, S. Thomann, H. Amrouch, and M. Avedillo. ICECS 2022, page 1-4. IEEE, (2022)Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness.O. Prakash, K. Ni, and H. Amrouch. IRPS, page 1-4. IEEE, (2023)On Extracting Reliability Information from Speed Binning.Z. Najafi-Haghi, F. Klemme, H. Amrouch, and H. Wunderlich. ETS, page 1-4. IEEE, (2022)

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Disambiguation of "Amrouch, Hussam"

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Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications.

Please choose a person to relate this publication to

Hussam Amrouch

Hussam Hamrawi

Hussam Haffar

Hussam Asi

Hussam Sheta

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Amrouch, Hussam"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications.

Please choose a person to relate this publication to

Hussam Amrouch

Hussam Hamrawi

Hussam Haffar

Hussam Asi

Hussam Sheta

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications.