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Debating the Future of Burn-In.

, , , , , и . VTS, стр. 311-314. IEEE Computer Society, (2002)

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Edward J Birkenbeil

Edward J Laarman

Edward J Birkenbeil

Edward Fischer

Edward Sobel

 

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Linear Feedback Shift Register Design Using Cyclic Codes., и . IEEE Trans. Computers, 37 (10): 1302-1306 (1988)Boolean Network Probabilities and Network Design., , и . IEEE Trans. Computers, 27 (2): 187-189 (1978)Simple Bounds on Serial Signature Analysis Aliasing for Random Testing., , и . IEEE Trans. Computers, 41 (5): 638-645 (1992)Lower Overhead Design for Testability of Programmable Logic Arrays., и . ITC, стр. 856-865. IEEE Computer Society, (1984)Concurrent System-Level Error Detection Using a Watchdog Processor., , и . ITC, стр. 145-152. IEEE Computer Society, (1985)Stuck-At Fault Detection in Parity Trees., , и . FJCC, стр. 836-840. IEEE Computer Society, (1986)On the Testing of Multiplexers., и . ITC, стр. 669-679. IEEE Computer Society, (1988)Bridging, Transition, and Stuck-Open Faults in Self-Testing CMOS Checkers., и . FTCS, стр. 154-161. IEEE Computer Society, (1991)Design of large embedded CMOS PLAs for built-in self-test., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 7 (1): 50-59 (1988)A Reliable LZ Data Compressor on Reconfigurable Coprocessors., , и . FCCM, стр. 249-258. IEEE Computer Society, (2000)