( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Testing statistical significance of the area under a Receiving Operating Characteristics curve for repeated measures design with bootstrapping

, , , и . Journal of Data Science, (2005)3842<m:linebreak></m:linebreak>Proves diagnòstiques.

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Liu Liu

Liu Liu

Liu Liu

H -H Kaatz

Florian H H Giesert

 

Другие публикации лиц с тем же именем

Evidence for the Direct Two-Photon Transition from \$\psi'\$ to \$J/\psi\$, , , , , , , , , и 348 other автор(ы). (01.04.2012)Measurements of the absolute branching fractions for \$D\_s^+\rightarrowe^+\nu\_e\$ and \$D\_s^+\rightarrow\eta^\prime e^+\nu\_e\$, , , , , , , , , и 415 other автор(ы). (23.08.2016)Measurement of the \$D\_s^+ \ell^+\nu\_\ell\$ branching fractions and the decay constant \$f\_D\_s^+\$, , , , , , , , , и 408 other автор(ы). (24.08.2016)Measurement of $e^+ e^- K^+ K^-$ cross section at $s = 2.00 - 3.08$ GeV, , , , , , , , , и 450 other автор(ы). (2018)cite arxiv:1811.08742Comment: 8 figures.Search for a light pseudoscalar Higgs boson in the dimuon decay channel in pp collisions at √s = 7 TeV, , , , , , , , , и 2183 other автор(ы). Phys Rev Lett, 109 (12): 121801-121801 (сентября 2012)The Physics of the B Factories, , , , , , , , , и 2024 other автор(ы). The European Physical Journal C, (08.07.2014)Physics at BES-III, , , , , , , , , и 75 other автор(ы). (10.09.2008)Superparamagnetic and photoluminescence of nanohole-arrayed MnZn ferrite thin film on PAA/GaN/sapphire thin films., , , и . NEMS, стр. 839-842. IEEE, (2011)Selective functionalization on ultra-thin body FETs., , , и . NEMS, стр. 1000-1003. IEEE, (2011)Characterizing and Reducing the Layout Dependent Effect and Gate Resistance to Enable Multiple-Vt Scaling for a 3nm CMOS Technology., , , , , , , , , и 6 other автор(ы). VLSI Technology and Circuits, стр. 1-2. IEEE, (2023)