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Delay-fault test generation and synthesis for testability under a standard scan design methodology., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 12 (8): 1217-1231 (1993)Inefficiency of K-FAC for Large Batch Size Training., , , , , , and . CoRR, (2019)FBNet: Hardware-Aware Efficient ConvNet Design via Differentiable Neural Architecture Search., , , , , , , , , and . CoRR, (2018)An automated exploration framework for FPGA-based soft multiprocessor systems., , , and . CODES+ISSS, page 273-278. ACM, (2005)Gate-Delay-Fault Testability Properties of Multiplexor-Based Networks., , and . ITC, page 887-896. IEEE Computer Society, (1991)Domain Randomization and Pyramid Consistency: Simulation-to-Real Generalization Without Accessing Target Domain Data., , , , , and . ICCV, page 2100-2110. IEEE, (2019)Rethinking Batch Normalization in Transformers., , , , and . CoRR, (2020)Coverage Metrics for Functional Validation of Hardware Designs., and . IEEE Des. Test Comput., 18 (4): 36-45 (2001)Code density optimization for embedded DSP processors using data compression techniques., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (7): 601-608 (1998)What is the Next Big Productivity Boost for Designers? (Panel Abstract).. DAC, page 141. ACM Press, (1993)