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Semi-Supervised Deep Learning for Microcontroller Performance Screening., , , , , and . ETS, page 1-6. IEEE, (2023)Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing., , , , , and . ETS, page 1-5. IEEE, (2023)U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration., , and . LOD (1), volume 14505 of Lecture Notes in Computer Science, page 364-378. Springer, (2023)Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor., , , , , and . ATS, page 73-78. IEEE, (2021)Industrial best practice: cases of study by automotive chip- makers., , , , , , , , , and 2 other author(s). DFT, page 1-6. IEEE, (2021)A suite of IEEE 1687 benchmark networks., , , , , , , , and . ITC, page 1-10. IEEE, (2016)Software-based self-test techniques of computational modules in dual issue embedded processors., , , , , , , and . ETS, page 1-2. IEEE, (2015)Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults., , , and . DDECS, page 124-129. IEEE, (2024)On the diagnostic analysis of IEEE 1687 networks., , , , and . ETS, page 1-2. IEEE, (2016)New techniques for functional testing of microprocessor based systems.. Polytechnic University of Turin, Italy, (2017)base-search.net (ftpoltorinoiris:oai:iris.polito.it:11583/2680228).