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Towards approximation during test of Integrated Circuits.

I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)

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Benoît Girard

Jules Girard

Adrien Girard

Pierre Girard

Yann Girard

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Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications.A. Yan, Z. Wu, J. Zhou, Y. Hu, Y. Chen, Z. Ying, X. Wen, and P. Girard. ATS, page 55-60. IEEE, (2019)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)From onions to broccoli: generalizing Lewis' counterfactual logic.P. Girard. J. Appl. Non Class. Logics, 17 (2): 213-229 (2007)Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS.A. Yan, S. Song, J. Zhang, J. Cui, Z. Huang, T. Ni, X. Wen, and P. Girard. ITC-Asia, page 73-78. IEEE, (2022)A Low Overhead and Double-Node-Upset Self-Recoverable Latch.A. Yan, F. Xia, T. Ni, J. Cui, Z. Huang, P. Girard, and X. Wen. ITC-Asia, page 1-5. IEEE, (2023)Voltage Bootstrapped Schmitt Trigger based Radiation Hardened Latch Design for Reliable Circuits.N. Gupta, N. Agrawal, N. Dhakad, A. Shah, S. Vishvakarma, and P. Girard. ACM Great Lakes Symposium on VLSI, page 307-312. ACM, (2021)Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications.A. Yan, Z. He, J. Xiang, J. Cui, Y. Zhou, Z. Huang, P. Girard, and X. Wen. ACM Great Lakes Symposium on VLSI, page 261-266. ACM, (2022)A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale CMOS Technology.A. Yan, Z. Zhou, S. Wei, J. Cui, Y. Zhou, T. Ni, P. Girard, and X. Wen. ACM Great Lakes Symposium on VLSI, page 255-260. ACM, (2022)Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications.A. Yan, Z. Xu, J. Cui, Z. Ying, Z. Huang, H. Liang, P. Girard, and X. Wen. ISCAS, page 1-5. IEEE, (2020)ProtoTask, New Task Model Simulator.T. Lachaume, P. Girard, L. Guittet, and A. Fousse. HCSE, volume 7623 of Lecture Notes in Computer Science, page 323-330. Springer, (2012)

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Disambiguation of "Girard, Patrick"

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Towards approximation during test of Integrated Circuits.

Please choose a person to relate this publication to

Benoît Girard

Jules Girard

Adrien Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Towards approximation during test of Integrated Circuits.

Please choose a person to relate this publication to

Benoît Girard

Jules Girard

Adrien Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

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URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Towards approximation during test of Integrated Circuits.