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Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications.

A. Yan, Z. Xu, J. Cui, Z. Ying, Z. Huang, H. Liang, P. Girard, and X. Wen. ISCAS, page 1-5. IEEE, (2020)

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Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

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Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Energy Model based Control for Forming Processes.P. Girard, and V. Thomson. ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments.A. Yan, Z. Li, J. Cui, Z. Huang, T. Ni, P. Girard, and X. Wen. IEEE Trans. Aerosp. Electron. Syst., 59 (3): 2885-2897 (June 2023)A Ring Architecture Strategy for BIST Test Pattern Generation.C. Fagot, O. Gascuel, P. Girard, and C. Landrault. J. Electron. Test., 19 (3): 223-231 (2003)Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata.A. Yan, R. Liu, J. Cui, T. Ni, P. Girard, X. Wen, and J. Zhang. IEEE Trans. Circuits Syst. II Express Briefs, 70 (6): 2256-2260 (June 2023)

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Disambiguation of "Girard, Patrick"

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Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
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Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications.