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Disambiguation of "Makris, Yiorgos"

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Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.

, , , and . DATE, page 553-558. EDA Consortium San Jose, CA, USA / ACM DL, (2013)

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Phokion Makris

Georgios Makris

Jannis Makris

Makris Wassilios

Panagiotis Makris

 

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Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations., , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2120-2133 (2017)Bias Busters: Robustifying DL-based Lithographic Hotspot Detectors Against Backdooring Attacks., , , , , and . CoRR, (2020)On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (12): 2522-2527 (2021)Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond., , , , and . IEEE Des. Test, 41 (2): 15-22 (2024)Demonstrating and Mitigating the Risk of an FEC-Based Hardware Trojan in Wireless Networks., , , , and . IEEE Trans. Inf. Forensics Secur., 14 (10): 2720-2734 (2019)Amplitude-Modulating Analog/RF Hardware Trojans in Wireless Networks: Risks and Remedies., , , , and . IEEE Trans. Inf. Forensics Secur., (2020)MANTIS: Machine Learning-Based Approximate ModeliNg of RedacTed Integrated CircuitS., , and . DATE, page 1-6. IEEE, (2023)Transparency-based hierarchical test generation for modular RTL designs., , , and . ISCAS, page 689-692. IEEE, (2000)TRANSPARENT: a system for RTL testability analysis, DFT guidance and hierarchical test generation., , , and . CICC, page 159-162. IEEE, (1999)Exploiting Off-Line Hierarchical Test Paths in Module Diagnosis and On-Line Test., and . LATW, page 250-255. IEEE, (2000)