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Variation and failure characterization through pattern classification of test data from multiple test stages., , , , , , and . ITC, page 1-10. IEEE, (2016)Design Methodology of an On-Chip Inductor in 180 nm CMOS Technology., , , and . MIPRO, page 65-69. IEEE, (2019)Design of CMOS Temperature Sensors Based on Ring Oscillators in 180-nm and 110-nm technology., , , and . MIPRO, page 104-108. IEEE, (2020)Measurement System for Characterization of a Resistor Array in 180-nm CMOS Technology., , , , , and . MIPRO, page 202-207. IEEE, (2023)Analysis of Wheatstone Bridge Sensitivity for Applications in Integrated Piezoresistive Stress Sensors., , , , , , and . MIPRO, page 1637-1642. IEEE, (2024)Relaxation oscillator calibration technique with comparator delay regulation., , and . MIPRO, page 57-61. IEEE, (2016)Characterization of measurement system for high-precision oscillator measurements., , , , and . MIPRO, page 88-92. IEEE, (2017)Scalable High Voltage CMOS technology for Smart Power and sensor applications., , , , , , , , , and . Elektrotech. Informationstechnik, 125 (4): 109-117 (2008)Low-Power Frequency-Locked Loop Circuit with Short Settling Time., , , , , and . MIPRO, page 174-179. IEEE, (2022)A Non-Volatile Embedded Memory for High Temperature Automotive and High-Retention Applications., , , , , , , and . ISQED, page 591-596. IEEE Computer Society, (2006)