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Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs.

, , , , , , , and . EMC Compo, page 37-41. IEEE, (2013)

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Chip-Level Substrate Noise Analysis with Emphasis of Vertical Impurity Profile for Isolation., , , and . CICC, page 849-852. IEEE, (2007)Session 20 overview: Energy harvesting and SC power conversion: Analog subcommittee., and . ISSCC, page 356-357. IEEE, (2015)An On-Chip Multichannel Waveform Monitor for Diagnosis of Systems-on-a-Chip Integration., and . IEEE Trans. Very Large Scale Integr. Syst., 15 (10): 1101-1110 (2007)Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation., , , , , and . IEICE Trans. Electron., 95-C (4): 586-593 (2012)High-Speed Digital Circuit Design Using Differential Logic with Asymmetric Signal Transition., , and . IEICE Trans. Electron., 88-C (10): 2001-2008 (2005)Substrate Noise Coupling in SoC Design: Modeling, Avoidance, and Validation., , , and . Proc. IEEE, 94 (12): 2109-2138 (2006)An on-chip multi-channel waveform monitor for mixed-signal VLSI diagnostics., and . ESSCIRC, page 295-298. IEEE, (2005)Quantitative characterization of substrate noise for physical design guides in digital circuits., , , and . CICC, page 95-98. IEEE, (2000)A Triturated Sensing System., , , , , , , and . ISSCC, page 216-217. IEEE, (2023)On-Chip Multi-Channel Waveform Monitoring for Diagnostics of Mixed-Signal VLSI Circuits., and . DATE, page 146-151. IEEE Computer Society, (2005)