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Investigating the Use of BICS to detect resistive-open defects in SRAMs., , , , , , and . IOLTS, page 200-201. IEEE Computer Society, (2010)Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits., , , , , and . DDECS, page 34-37. IEEE Computer Society, (2008)Predictive error detection by on-line aging monitoring., , , , , , , and . IOLTS, page 9-14. IEEE Computer Society, (2010)MOSYS A Methodology for Automatic Object Identification from System Specification., , , , and . ISORC, page 198-201. IEEE Computer Society, (2000)Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels., , , , , , , , and . ISCAS, page 1185-1188. IEEE, (2010)Performance Sensor for Reliable Operation., , , , and . HCI (8), volume 10908 of Lecture Notes in Computer Science, page 347-365. Springer, (2018)Time Management for Low-Power Design of Digital Systems., , , , , , and . J. Low Power Electron., 4 (3): 410-419 (2008)Test preparation methodology for high coverage of physical defects in CMOS digital ICs., , , and . ED&TC, page 604. IEEE Computer Society, (1995)Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip., , , , , and . J. Electron. Test., 21 (4): 349-363 (2005)RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST., , , , , and . ITC, page 814-823. IEEE Computer Society, (2002)