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An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.

, , , , , , и . ETS, стр. 1-6. IEEE, (2022)

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Markus Bernardi

Giordano Paolo

Andreas Bernardi

Mirko Bernardi

Mariangela Bernardi

 

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Test Considerations about the Structured ASIC Paradigm., и . DDECS, стр. 232-233. IEEE Computer Society, (2006)A novel SEU injection setup for Automotive SoC., , , , , , , и . ISIE, стр. 623-626. IEEE, (2022)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , и 11 other автор(ы). IOLTS, стр. 1-10. IEEE, (2022)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , и . DFT, стр. 1-6. IEEE, (2022)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , и . DDECS, стр. 69-74. IEEE, (2021)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , и . VTS, стр. 1-7. IEEE, (2023)Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs., , , , , и . VLSI-SoC (Selected Papers), том 508 из IFIP Advances in Information and Communication Technology, стр. 130-151. Springer, (2016)SW-based transparent in-field memory testing., , , и . LATS, стр. 1-6. IEEE Computer Society, (2015)Cumulative embedded memory failure bitmap display & analysis., , , , , , , и . DDECS, стр. 255-260. IEEE Computer Society, (2010)An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase., , , и . Asian Test Symposium, стр. 227-232. IEEE Computer Society, (2013)