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Disambiguation of "Appello, Davide"

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An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.

, , , , , , and . ETS, page 1-6. IEEE, (2022)

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Davide Pennino

Davide Cadamuro

Davide Batic

Davide Pagani

Davide Cantoni

 

Other publications of authors with the same name

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC., , , , , , and . J. Electron. Test., 34 (1): 43-52 (2018)High Accuracy Stimulus Generation for A/D Converter BIST., , , and . ITC, page 1031-1039. IEEE Computer Society, (2002)The Yield of Test Outsourcing.. ITC, page 1215. IEEE Computer Society, (2002)Applicative System Level Test introduction to Increase Confidence on Screening Quality., , , , , and . DDECS, page 1-6. IEEE, (2020)Evaluating Alpha-induced soft errors in embedded microprocessors., , , , , , and . IOLTS, page 69-74. IEEE Computer Society, (2009)On the Automation of the Test Flow of Complex SoCs., , , , , and . VTS, page 166-171. IEEE Computer Society, (2006)An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs., , , , and . ETS, page 140-145. IEEE Computer Society, (2008)Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores., , , , , , and . ITC, page 379-385. IEEE Computer Society, (2003)A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis., , , , and . Asian Test Symposium, page 97-102. IEEE Computer Society, (2001)