( en | de | ru )

 

Disambiguation of "Flottes, Marie-Lise"

Author of the publication

copydeleteadd this publication to your clipboard
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ.

, , , , , , , , , and . DELTA, page 135-139. IEEE Computer Society, (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Marie-Lise Weber

Marie-Lise Schläppy

Bernd Lisek

Lise Barbin

Ubiquitin-proteasome dependent catabolite degradation of fructose-1,6-bisphosphatase: localization and involvement of novel components. Uni Stuttgart, (2009)

Ulrike Lisewski

 

Other publications of authors with the same name

A smart test controller for scan chains in secure circuits., , , and . IOLTS, page 228-229. IEEE, (2013)Are advanced DfT structures sufficient for preventing scan-attacks?, , , and . VTS, page 246-251. IEEE Computer Society, (2012)Automatic Synthesis of BISTed Data Paths From High Level Specification., , and . EDAC-ETC-EUROASIC, page 591-598. IEEE Computer Society, (1994)A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis., , and . J. Electron. Test., 17 (3-4): 331-339 (2001)Laser-induced fault effects in security-dedicated circuits., , , , , , , , , and 9 other author(s). VLSI-SoC, page 1-6. IEEE, (2014)Preventing Scan Attacks on Secure Circuits Through Scan Chain Encryption., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (3): 538-550 (2019)A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard., , , and . J. Electron. Test., 25 (4-5): 269-278 (2009)A Lightweight, Plug-and-Play and Autonomous JTAG Authentication IP for Secure Device Testing., , , , , and . ETS, page 1-4. IEEE, (2022)Execution time reduction of Differential Power Analysis experiments., , and . LATW, page 1-5. IEEE, (2009)3D DFT Challenges and Solutions., , , , , and . ISVLSI, page 603-608. IEEE Computer Society, (2015)