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Open Microphone - My DFT is better than yours ...

, и . ITC, стр. 1285. IEEE Computer Society, (2003)

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Ellen Eide

Geir Volden

Eugen Eide

Bettina Geirhos

Karl Geiringer

 

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Design-for-Test Techniques for SoC Designs (Tutorial Abstract).. ISQED, стр. 7. IEEE Computer Society, (2002)Deriving Feature Fail Rate from Silicon Volume Diagnostics Data., , , , , и . IEEE Des. Test, 30 (4): 26-34 (2013)Employing the STDF V4-2007 Standard for Scan Test Data Logging., , , , , и . IEEE Des. Test, 29 (6): 91-99 (2012)The Advancement of 1149.10., , , , , , и . ITC-Asia, стр. 1. IEEE, (2021)Key Impediments to DFT-Focused Test and How to Overcome Them., и . ITC, стр. 503-511. IEEE Computer Society, (2003)Open Microphone - My DFT is better than yours ..., и . ITC, стр. 1285. IEEE Computer Society, (2003)Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs., , , , , , , , , и 3 other автор(ы). ITC, стр. 1-10. IEEE, (2020)ITC 2003 panels: Part 2., , , , и . IEEE Des. Test Comput., 21 (3): 175-176, 261-262 (2004)Embedded Deterministic Test for Low-Cost Manufacturing Test., , , , , , , , , и 1 other автор(ы). ITC, стр. 301-310. IEEE Computer Society, (2002)Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data., , , , , , , , , и 1 other автор(ы). ATS, стр. 219-224. IEEE Computer Society, (2017)