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Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing., , , , , и . LATW, стр. 1-6. IEEE, (2014)Smart selection of indirect parameters for DC-based alternate RF IC testing., , , , , , , и . VTS, стр. 19-24. IEEE Computer Society, (2012)New implementions of predictive alternate analog/RF test with augmented model redundancy., , , , , и . DATE, стр. 1-4. European Design and Automation Association, (2014)A high accuracy triangle-wave signal generator for on-chip ADC testing., , , и . ETW, стр. 89-94. IEEE Computer Society, (2002)Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC., , , , , и . IET Comput. Digit. Tech., 1 (3): 146-153 (2007)On the detectability of CMOS floating gate transistor faults., , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 20 (1): 116-128 (2001)Guest Editorial., , и . J. Electron. Test., 21 (3): 203 (2005)A New FPGA for DSP Applications Integrating BIST Capabilities., , , и . J. Electron. Test., 20 (4): 423-431 (2004)A Specific Test Methodology for Symmetric SRAM-Based FPGAs.. FPL, том 1896 из Lecture Notes in Computer Science, стр. 300-311. Springer, (2000)Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits., , и . ATS, стр. 239-244. IEEE, (2007)