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Disambiguation of "Rajski, Janusz"

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Test Time Reduction in EDT Bandwidth Management for SoC Designs.

, , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (11): 1776-1786 (2013)

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Janusz Panzer

Janusz Rat

Janusz Gatniejewski

Janusz Surzykiewicz

Janusz Bogdanowicz

 

Other publications of authors with the same name

Embedded Deterministic Test for Low-Cost Manufacturing., , , , , and . IEEE Des. Test Comput., 20 (5): 58-66 (2003)2D Test Sequence Generators., , and . IEEE Des. Test Comput., 20 (1): 51-59 (2003)H2B: Crypto Hash Functions Based on Hybrid Ring Generators., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (2): 442-455 (February 2024)On Using Implied Values in EDT-based Test Compression., , , , and . DAC, page 11:1-11:6. ACM, (2014)Cube-Contained Random Patterns and Their Applications to the Complete Testing of Synthesized Multi-Level Circuits., and . ITC, page 473-482. IEEE Computer Society, (1991)GEMINI-a logic system for fault diagnosis based on set functions.. FTCS, page 292-297. IEEE Computer Society, (1988)Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (4): 683-693 (2017)Embedded deterministic test., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (5): 776-792 (2004)Hardware Protection via Logic Locking Test Points., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (12): 3020-3030 (2018)On necessary and nonconflicting assignments in algorithmic test pattern generation., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 13 (4): 515-530 (1994)