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Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM).

, , , , , , , , , , , , , , , , , , и . A-SSCC, стр. 169-172. IEEE, (2016)

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Jong Hoon Shin

Sang-Hoon Song

Sang Hoon Kim

Myoung-Hoon Shin

Sang-Hoon Park

 

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