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Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.

X. Wen, K. Miyase, T. Suzuki, S. Kajihara, Y. Ohsumi, and K. Saluja. DAC, page 527-532. IEEE, (2007)

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Kohei Tatsumi

Mohamed Koheil

Susanne Koheil

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LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing.Y. Yamato, K. Miyase, S. Kajihara, X. Wen, L. Wang, and M. Kochte. IEEE Des. Test, 30 (4): 60-70 (2013)Don't Care Identification and Statistical Encoding for Test Data Compression.S. Kajihara, K. Taniguchi, K. Miyase, I. Pomeranz, and S. Reddy. IEICE Trans. Inf. Syst., 87-D (3): 544-550 (2004)A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits.K. Miyase, M. Aso, R. Ootsuka, X. Wen, H. Furukawa, Y. Yamato, K. Enokimoto, and S. Kajihara. VTS, page 197-202. IEEE Computer Society, (2012)Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory.S. Lu, H. Li, and K. Miyase. IOLTS, page 226-227. IEEE, (2018)On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption.Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, and J. Qian. IEICE Trans. Inf. Syst., 104-D (6): 816-827 (2021)On Improving Defect Coverage of Stuck-at Fault Tests.K. Miyase, K. Terashima, S. Kajihara, X. Wen, and S. Reddy. Asian Test Symposium, page 216-223. IEEE Computer Society, (2005)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression.K. Enokimoto, X. Wen, K. Miyase, J. Huang, S. Kajihara, and L. Wang. VLSI Design, page 279-284. IEEE Computer Society, (2013)A Method of Static Test Compaction Based on Don't Care Identification.K. Miyase, S. Kajihara, and S. Reddy. DELTA, page 392-395. IEEE Computer Society, (2002)A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits.Y. Yamato, Y. Nakamura, K. Miyase, X. Wen, and S. Kajihara. IEICE Trans. Inf. Syst., 91-D (3): 667-674 (2008)A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing.Y. Yamato, X. Wen, K. Miyase, H. Furukawa, and S. Kajihara. IEICE Trans. Inf. Syst., 94-D (4): 833-840 (2011)

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Disambiguation of "Miyase, Kohei"

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Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.

Please choose a person to relate this publication to

Kohei Tatsumi

Kohei Tatsumi

Mohamed Koheil

Susanne Koheil

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Miyase, Kohei"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.

Please choose a person to relate this publication to

Kohei Tatsumi

Kohei Tatsumi

Mohamed Koheil

Susanne Koheil

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.