Author of the publication

Diagnosis of MRAM Write Disturbance Fault.

, , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 18 (12): 1762-1766 (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Testing methods for quaternary content addressable memory using charge-sharing sensing scheme., , , , , , and . ITC, page 1-10. IEEE, (2015)Diagnosis of MRAM Write Disturbance Fault., , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 18 (12): 1762-1766 (2010)Write Disturbance Modeling and Testing for MRAM., , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 16 (3): 277-288 (2008)A Processor-Based Built-In Self-Repair Design for Embedded Memories., , and . Asian Test Symposium, page 366-371. IEEE Computer Society, (2003)An Integrated ECC and Redundancy Repair Scheme for Memory Reliability Enhancement., , and . DFT, page 81-92. IEEE Computer Society, (2005)A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2184-2194 (2011)Testing MRAM for Write Disturbance Fault., , , , , and . ITC, page 1-9. IEEE Computer Society, (2006)MRAM Defect Analysis and Fault Modeli., , , , , , and . ITC, page 124-133. IEEE Computer Society, (2004)Generalization of an Enhanced ECC Methodology for Low Power PSRAM., , , and . IEEE Trans. Computers, 62 (7): 1318-1331 (2013)Fail Pattern Identification for Memory Built-In Self-Repair., , , , , and . Asian Test Symposium, page 366-371. IEEE Computer Society, (2004)