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Diagnosis of MRAM Write Disturbance Fault.

C. Su, C. Tsai, C. Chen, W. Lo, C. Wu, J. Chen, W. Wu, C. Hung, and M. Kao. IEEE Trans. Very Large Scale Integr. Syst., 18 (12): 1762-1766 (2010)

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Ming-Jer Tsai

Ming-Rea Kao

Odej Kao

Daniela Kao

Georgios Kaouras

Other publications of authors with the same name

Low power design of phase-change memory based on a comprehensive model.M. Chiang, Y. Liao, J. Lin, W. Hsu, C. Yu, P. Chiang, Y. Hsu, W. Liu, S. Sheu, K. Su and 2 other author(s). IET Comput. Digit. Tech., 4 (4): 285-292 (2010)Set-Triggered-Parallel-Reset Memristor Logic for High-Density Heterogeneous-Integration Friendly Normally Off Applications.M. Chang, S. Yang, C. Kuo, T. Yang, C. Yeh, T. Chien, L. Huang, S. Sheu, P. Tseng, Y. Chen and 4 other author(s). IEEE Trans. Circuits Syst. II Express Briefs, 62-II (1): 80-84 (2015)A nonvolatile look-up table using ReRAM for reconfigurable logic.W. Lin, S. Sheu, C. Kuo, P. Tseng, M. Chang, K. Su, C. Lin, K. Tsai, S. Lee, S. Liu and 7 other author(s). A-SSCC, page 133-136. IEEE, (2014)Testing MRAM for Write Disturbance Fault.C. Su, C. Tsai, C. Wu, C. Hung, Y. Chen, and M. Kao. ITC, page 1-9. IEEE Computer Society, (2006)MRAM Defect Analysis and Fault Modeli.C. Su, R. Huang, C. Wu, C. Hung, M. Kao, Y. Chang, and W. Wu. ITC, page 124-133. IEEE Computer Society, (2004)Challenges of Cu CMP of TSVs and RDLs fabricated from the backside of a thin wafer.J. Chen, J. Lau, T. Hsu, C. Chen, P. Tzeng, P. Chang, C. Chien, Y. Chang, S. Chen, Y. Hsin and 4 other author(s). 3DIC, page 1-5. IEEE, (2013)Diagnosis for MRAM write disturbance fault.C. Su, C. Tsai, C. Wu, J. Chen, W. Wu, C. Hung, and M. Kao. ITC, page 1-9. IEEE Computer Society, (2007)A High-Speed 7.2-ns Read-Write Random Access 4-Mb Embedded Resistive RAM (ReRAM) Macro Using Process-Variation-Tolerant Current-Mode Read Schemes.M. Chang, S. Sheu, K. Lin, C. Wu, C. Kuo, P. Chiu, Y. Yang, Y. Chen, H. Lee, C. Lien and 5 other author(s). IEEE J. Solid State Circuits, 48 (3): 878-891 (2013)ReRAM-based 4T2R nonvolatile TCAM with 7x NVM-stress reduction, and 4x improvement in speed-wordlength-capacity for normally-off instant-on filter-based search engines used in big-data processing.L. Huang, M. Chang, C. Chuang, C. Kuo, C. Chen, G. Yang, H. Tsai, T. Chen, S. Sheu, K. Su and 4 other author(s). VLSIC, page 1-2. IEEE, (2014)Diagnosis of MRAM Write Disturbance Fault.C. Su, C. Tsai, C. Chen, W. Lo, C. Wu, J. Chen, W. Wu, C. Hung, and M. Kao. IEEE Trans. Very Large Scale Integr. Syst., 18 (12): 1762-1766 (2010)

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Disambiguation of "Kao, Ming-Jer"

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Diagnosis of MRAM Write Disturbance Fault.

Please choose a person to relate this publication to

Ming-Jer Tsai

Ming-Rea Kao

Odej Kao

Daniela Kao

Georgios Kaouras

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Kao, Ming-Jer"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Diagnosis of MRAM Write Disturbance Fault.

Please choose a person to relate this publication to

Ming-Jer Tsai

Ming-Rea Kao

Odej Kao

Daniela Kao

Georgios Kaouras

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Diagnosis of MRAM Write Disturbance Fault.