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Disambiguation of "Pae, Sangwoo"

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A systematic study of gate dielectric TDDB in FinFET technology.

, , , , , , , , and . IRPS, page 4. IEEE, (2018)

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Sangwoo Shin

i-suk Pae

Chin-ae Pae

Sang-jun Pae

Kyung Sik Pae

 

Other publications of authors with the same name

Optimal design of dummy ball array in wafer level package to improve board level thermal cycle reliability (BLR)., , , , , , , , , and 1 other author(s). IRPS, page 3. IEEE, (2018)SRAM stability design comprehending 14nm FinFET reliability., , , , , and . IRPS, page 13. IEEE, (2015)Systematical study of 14nm FinFET reliability: From device level stress to product HTOL., , , , , , , , , and 3 other author(s). IRPS, page 2. IEEE, (2015)Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2020)Reliability of Industrial grade Embedded-STT-MRAM., , , , , , , , , and 21 other author(s). IRPS, page 1-3. IEEE, (2020)Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit., , , , , and . IRPS, page 1-5. IEEE, (2019)Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI., , , , , , , , , and 10 other author(s). IRPS, page 3. IEEE, (2018)The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress., , , , , , , , and . IRPS, page 1-4. IEEE, (2021)Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology., , , , , , , , , and 8 other author(s). IRPS, page 1-5. IEEE, (2020)Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology., , , , , , , , , and 1 other author(s). IRPS, page 6. IEEE, (2018)