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Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.

L. Zordan, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, and N. Badereddine. DDECS, page 353-358. IEEE Computer Society, (2011)

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Benoît Girard

Adrien Girard

Pierre Girard

Jules Girard

Yann Girard

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Logical dynamics of belief change in the community.F. Liu, J. Seligman, and P. Girard. Synthese, 191 (11): 2403-2431 (2014)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)Energy Model based Control for Forming Processes.P. Girard, and V. Thomson. ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Prioritised ceteris paribus logic for counterfactual reasoning.P. Girard, and M. Triplett. Synthese, 195 (4): 1681-1703 (2018)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)An advanced diagnostic method for delay faults in combinational faulty circuits.P. Girard, C. Landrault, and S. Pravossoudovitch. J. Electron. Test., 6 (3): 277-294 (1995)

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Disambiguation of "Girard, Patrick"

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Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Pierre Girard

Jules Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Pierre Girard

Jules Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.