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Disambiguation of "Nakamura, Yoshiyuki"

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A System of Card Type Battery-Less Information Terminal: CardBIT for Situated Interactio.

, , , and . PerCom, page 369-377. IEEE Computer Society, (2003)

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Shin'ichiro Nakamura

Makoto Nakamura

Akira Nakamura

Hideki Nakamura

Hatsuo Nakamura

 

Other publications of authors with the same name

Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST., , and . IEICE Trans. Inf. Syst., 88-D (6): 1210-1216 (2005)Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch., , , and . IEICE Trans. Inf. Syst., 89-D (3): 1165-1172 (2006)A kernel thread running on the outside of the kernel and its implementation., , , and . Syst. Comput. Jpn., 34 (8): 42-50 (2003)Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester., , , and . ATS, page 409-414. IEEE, (2006)Good Die Prediction Modelling from Limited Test Items., , , and . ITC-Asia, page 115-120. IEEE, (2018)Inferring Long-term User Properties Based on Users' Location History., , , , , , and . IJCAI, page 2159-2165. (2007)Doing Community: Co-construction of Meaning and Use with Interactive Information Kiosks., , , , , and . UbiComp, volume 4206 of Lecture Notes in Computer Science, page 387-403. Springer, (2006)Automatic process design from nonprocedural specification., , and . Syst. Comput. Jpn., 26 (3): 1-16 (1995)Spinning Multiple Social Networks for Semantic Web., , , , , , , , and . AAAI, page 1381-1387. AAAI Press, (2006)Artificial Neural Network Based Test Escape Screening Using Generative Model., , and . ITC, page 1-8. IEEE, (2018)