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Scheduling dual-arm cluster tools with multiple wafer types and residency time constraints., , , , и . IEEE CAA J. Autom. Sinica, 7 (3): 776-789 (2020)Modeling and scheduling of cluster tools dealing with wafer revisiting: A brief review., , , и . ICNSC, стр. 271-276. IEEE, (2015)Scheduling Cluster Tools in Semiconductor Manufacturing: Recent Advances and Challenges., , , и . IEEE Trans Autom. Sci. Eng., 15 (2): 586-601 (2018)Design Optimization of Support Structures Based on Numerical Simulation of the Temperature Fields in Selective Laser Melting., , и . ICNSC, стр. 1-5. IEEE, (2021)Parallel Petri Nets Modeling Method Of Manufacturing System Based On The improved PDDL., , , , и . ICNSC, стр. 1-6. IEEE, (2022)Noise Reduction Study of Signal Detection in Hall Sensors by Modal Analysis., , , , и . ICNSC, стр. 1-6. IEEE, (2022)Response Policies to Process Module Failure in Single-Arm Cluster Tools Subject to Wafer Residency Time Constraints., , , и . IEEE Trans Autom. Sci. Eng., 12 (3): 1125-1139 (2015)A novel failure response policy for single-arm cluster tools with residency time constraints., , , и . SMC, стр. 120-126. IEEE, (2014)Schedulability analysis for dual-armed cluster tools with mixed-processing of multi-variety wafers., , и . ICNSC, стр. 501-506. IEEE, (2017)Transient Process Optimization for Dual-Arm Cluster Tools With Wafer Revisiting., , , и . IEEE Access, (2021)