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Modeling the Interdependences Between Voltage Fluctuation and BTI Aging.

, , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (7): 1652-1665 (2019)

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Modeling the Interdependences Between Voltage Fluctuation and BTI Aging., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (7): 1652-1665 (2019)Impact of NCFET on Neural Network Accelerators., , , , , and . IEEE Access, (2021)Reliability Challenges with Self-Heating and Aging in FinFET Technology., , , , , , and . IOLTS, page 68-71. IEEE, (2019)Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient., , , , and . IEEE Access, (2021)Reliability-Aware Quantization for Anti-Aging NPUs., , , , , and . DATE, page 1460-1465. IEEE, (2021)PROTON: Post-Synthesis Ferroelectric Thickness Optimization for NCFET Circuits., , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 68 (10): 4299-4309 (2021)Dynamic Power and Energy Management for NCFET-Based Processors., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (11): 3361-3372 (2020)NCFET-Aware Voltage Scaling., , , , , and . ISLPED, page 1-6. IEEE, (2019)Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU., , , , , , and . IEEE Trans. Computers, 71 (4): 906-918 (2022)Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows., , and . DATE, page 1-6. IEEE, (2023)